AFMsetup.jpg(721 × 569 piksela, veličina datoteke: 86 KB, MIME tip: image/jpeg)

Sažetak

Opis
English: Typical atomic force microscope (AFM) setup: The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample.
Deutsch: Typischer Aufbau eines Rasterkraftmikroskops (RKM): Die Auslenkung eines Abtastarms (Englisch: Cantilever) mit einer feinen Tastspitze wird während des Abtastens der Oberfläche anhand der Auslenkung eines Laserstrahls bestimmt, der von der Oberseite des Abtastarms reflektiert wird.
Datum 2013-10-13--202.160.164.205 09:49, 3 October 2013 (UTC)--202.160.164.205 09:49, 3 October 2013 (UTC)
Izvor

http://kristian.molhave.dk

Autor yashvant
Dopuštenje
(Naknadno korištenje ove datoteke)
CC-BY-2.5, please acknowledge the Opensource Handbook of Nanoscience and Nanotechnology if you use this illustration!

Licenciranje

w:bs:Creative Commons
pripisivanje
Ova datoteka je licencirana pod Creative Commons Attribution 2.5 generičkom licencom.
Slobodni ste:
  • da dijelite – da kopirate, distributirate i prenosite djelo
  • da remiksate – da prilagodite djelo
Pod sljedećim uslovima:
  • pripisivanje – Morate pripisati odgovarajuće autorske zasluge, osigurati link ka licenci i naznačiti jesu li napravljene izmjene. To možete uraditi na bilo koji razumni način, ali ne tako da se sugerira da davalac licence odobrava Vas ili Vašu upotrebu njegovog djela.

Captions

Add a one-line explanation of what this file represents

Items portrayed in this file

prikazuje

MIME type engleski

image/jpeg

checksum engleski

e554ced62e546be1eaba9097f6f6078f0da81eca

data size engleski

88.071 Bajt

569 piksel

721 piksel

Historija datoteke

Kliknite na datum/vrijeme da vidite verziju datoteke iz tog vremena.

Datum/vrijemeSmanjeni pregledDimenzijeKorisnikKomentar
trenutno16:10, 21 novembar 2006Smanjeni pregled verzije na dan 16:10, 21 novembar 2006721 × 569 (86 KB)KristianMolhave*Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured be reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. *This illustration was made

Sljedeće 2 stranice koriste ovu datoteku:

Globalna upotreba datoteke

Sljedeći wikiji koriste ovu datoteku:

Pogledajte globalne upotrebe ove datoteke.